HVK |
Andrea Da Re ed HVK sono fornitori di consulenza formazione coaching metrologia in campo metrologico |
Metrological Consultancy |
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info@hvk.to.it | Who I am |
Training |
Consulenze metrologiche Coaching metrologico metrologia Formazione metrologica misure reverse engineering misurazioni servizi di misura |
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V-Stars system.
In his basic configuration, It is composed by a Custom Camera and the V-Stars software that manages the acquired images in order to compute the position of the targeted points in the 3D scene. V-Stars S is the single camera system that measure the scene with multiple shots made by the same camera in different positions. In a second moment the V-Stars software analyzes the images and compute the targeted points, reason of Its name: off-line photogrammetry. The best accuracy and versatility is given by this systems, available in three different models: V-Stars N Platinum, Gold and Silver, capable of accuracy in the range between 5 um +/- 5 umm/m and 10 um +/- 10 um/m V-Stars M is a multiple camera system that allows real-time measuerments and works as a Portable CMM, in stable and unstable environments. The system can measure targeted points, tactile wireless probe and projected PRO-SPOT points, and, using high speed high accuracy cameras, allows accuracy in the range between 10 um +/- 10 um/m and 14 um +/- 14 um/m V-Stars D is the high speed multiple camera system, able to measure up to 10 Hz on target, tactile wireless probe and projected PRO-SPOT points. The system uses special cameras, the DynaMo D5 and D12 that allow to measure with accuracy up to 14 um +/- 14 um/m (D5 @ 10 Hz) and 10 um +/- 10 um/m (D12 @ 3 Hz) Hardware. DynaMo D5 and D10 Cameras V-Stars N Cameras Passive Retroretarget Tactile Wireless Probe PRO-SPOT (More Info) |
We can supply You:Measurement, metrological consultancy, Instrument Management, Control Plan Management, Uncertainty Evaluation, Metrology Automation, Optical Instruments, Portable Instruments, Multi-Instruments Measurement, R&R, Reverse Engineering, Statistics, Metrology Risk Management. |